| 标题 |
Low‐Frequency Noise Spectroscopy for Navigating Geometrically Varying Strain Effects in HfO 2 Ferroelectric FETs |
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| DOI | |
| 其它 |
期刊:Advanced Science 作者:Ryun‐Han Koo; Wonjun Shin; Sangwoo Kim; Jangsaeng Kim; Been Kwak; et al 出版日期:2025-04-02 |
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(2025-6-4)