| 标题 |
Impacts of HF etching on ultra-thin core gate oxide integrity in dual gate oxide CMOS technology |
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| DOI | |
| 其它 |
期刊:2003 8th International Symposium Plasma- and Process-Induced Damage. 作者:Da-Yuan Lee; Horng-Chih Lin; Chia-Lin Chen; Tiao-Yuan Huang; Tahui Wang; et al 出版日期:2003-10-31 |
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(2025-6-4)