| 标题 |
Study of reliability-efficiency tradeoff of active thermal control for power electronic systems |
| 网址 | |
| DOI | |
| 其它 |
期刊:Microelectronics Reliability 作者:Markus Andresen; Giampaolo Buticchi; Marco Liserre 出版日期:2015-12-19 |
| 求助人 | |
| 下载 |
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(2025-6-4)