| 标题 |
Open-IndDet: Advancing Open-Set Industrial Surface Defect Detection via Robust Class-Unique Feature Representation |
| 网址 | |
| DOI | |
| 其它 |
期刊:IEEE Transactions on Circuits and Systems for Video Technology 作者:Zhen Yang; Tianyong Zheng; Xuefeng Ni; Zhi Yan; Hong Chen; et al 出版日期:2025-09-23 |
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(2025-6-4)