| 标题 |
A Coupled Two-Stage PINN Driven by Physical and Data Factors for Combined Electromigration and Thermomigration Stress Prediction |
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| DOI | |
| 其它 |
期刊:2025 5th International Conference on Electron Devices and Applications (ICEDA) 作者:Shuhan Zhang; Zheyu Luo; Yumao Wu; Kaihui Wang 出版日期:2025-12-19 |
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(2025-6-4)