| 标题 |
Experimental and numerical analysis of the multi-recessed gate structure for microwave silicon carbide power MESFETs |
| 网址 | |
| DOI | |
| 其它 |
期刊:Chinese Physics B 作者:Deng Xiao-Chuan; Feng Zhen; Zhang Bo; Li Zhao-Ji; Li Liang; Pan Hong-Shu 出版日期:2009-07-09 |
| 求助人 | |
| 下载 |
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(2025-6-4)