| 标题 |
Full Chip Backside Delayering of 10 nm Node Integrated Circuits with Chemically Assisted Focused Ion Beam Deprocessing |
| 网址 | |
| DOI |
10.31399/asm.edfa.2025-1.p003
doi
|
| 其它 |
期刊:EDFA Technical Articles 作者:Michael DiBattista; Ata Tafazoli Yazdi; Jonathan Sheeder; Scott Silverman; Robert Chivas 出版日期:2025-02-01 |
| 求助人 | |
| 下载 | 暂无链接,等待应助者上传 |
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(2025-6-4)