| 标题 |
Evaluation of the High Mobility and Stability of InGaZnO/InSnZnO Bilayer Thin-Film Transistors via Quantitative Defect Analysis |
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| 其它 |
期刊:Surfaces and Interfaces 作者:Teklebrahan Gebrekrstos Weldemhret; Dong‐Joon Yi; Kwangsik Jeong; Kwun‐Bum Chung 出版日期:2025-06-06 |
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(2025-6-4)