| 标题 |
Theoretical analysis of 4H-SiC/SiO 2 interface structures and band alignments: effects of NO annealing |
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| DOI | |
| 其它 |
期刊:Japanese Journal of Applied Physics 作者:Naoto Ise; Toru Akiyama; Tetsuo Hatakeyama; Kenji Shiraishi; Takashi Nakayama 出版日期:2026-02-06 |
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(2025-6-4)