| 标题 |
Study of degradation in InGaP/InGaAs/Ge multi-junction solar cell characteristics due to irradiation-induced deep level traps using finite element analysis |
| 网址 | |
| DOI | |
| 其它 |
期刊:Solar Energy 作者:Siva Kotamraju; M. Sukeerthi; Suresh E. Puthanveettil; M. Sankaran 出版日期:2018-12-20 |
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(2025-6-4)