| 标题 |
Layout optimization and trade-off between 193i and EUV-based patterning for SRAM cells to improve performance and process variability at 7nm technology node |
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| DOI | |
| 其它 |
期刊:SPIE Proceedings 作者:Sushil Sakhare; Darko Trivkovic; Tom Mountsier; Min-Soo Kim; Dan Mocuta; et al 出版日期:2015-03-19 |
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(2025-6-4)