Research on the Thickness of the Buffer Layer in ZnO Thin Films
作者
Xinxi Zhang
摘要
Sol-Gel for the buffer layer is introduced, and ZnO thin films were deposited on the buffer layer. By the research on the formula of the layer thickness, the control of layer thickness can be achieved. The crystalline quality and morphology of ZnO thin film had been systematically investigated by means of X-Ray Diffraction(XRD)and Atomic Force Microscopy(AFM).