莫特绝缘子
凝聚态物理
金属-绝缘体过渡
莫特跃迁
电阻式触摸屏
等结构
兴奋剂
材料科学
物理
电阻率和电导率
电气工程
超导电性
晶体结构
化学
结晶学
量子力学
工程类
赫巴德模型
作者
Danylо Babich,Julien Tranchant,Coline Adda,B. Corraze,Marie‐Paule Besland,Warnicke, P.,Daniel Bedau,Patricia Bertoncini,J.-y Mevellec,Bernard Humbert,Jonathan A. J. Rupp,Tyler Hennen,Dirk J. Wouters,Roger Llopis,Laurent Cario,Étienne Janod
标识
DOI:10.48550/arxiv.2105.05093
摘要
Since the beginnings of the electronic age, a quest for ever faster and smaller switches has been initiated, since this element is ubiquitous and foundational in any electronic circuit to regulate the flow of current. Mott insulators are promising candidates to meet this need as they undergo extremely fast resistive switching under electric field. However the mechanism of this transition is still under debate. Our spatially-resolved μ-XRD imaging experiments carried out on the prototypal Mott insulator (V0.95Cr0.05)2O3 show that the resistive switching is associated with the creation of a conducting filamentary path consisting in an isostructural compressed phase without any chemical nor symmetry change. This clearly evidences that the resistive switching mechanism is inherited from the bandwidth-controlled Mott transition. This discovery might hence ease the development of a new branch of electronics dubbed Mottronics.
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