材料科学
缓冲器(光纤)
图层(电子)
硫化镉
化学浴沉积
开路电压
成核
光电子学
能量转换效率
纳米技术
带隙
化学
电压
物理
电气工程
工程类
有机化学
量子力学
冶金
作者
Pravin S. Pawar,Raju Nandi,Krishna Rao Eswar Neerugatti,Indu Sharma,Rahul K. Yadav,Yong Tae Kim,Jae Yu Cho,Jaeyeong Heo
出处
期刊:Solar Energy
[Elsevier BV]
日期:2022-10-06
卷期号:246: 141-151
被引量:21
标识
DOI:10.1016/j.solener.2022.09.044
摘要
• Atomic layer deposition of SnO 2 and TiO 2 buffer layers . • Structural and morphological study of Sb 2 S 3 deposited on double buffer layers. • Fabrication of superstrate architecture Sb 2 S 3 solar cell devices. • Improvement in efficiency from ∼3.0% to ∼4.23% using double buffer layers. The application of double buffer layers has been proven to be a beneficial approach for the enhancement of the power conversion efficiency (PCE) of antimony sulfide (Sb 2 S 3 ) thin-film solar cells (TFSCs). Recently, solution-processed SnO 2 /CdS, TiO 2 /CdS, ZnMgO/CdS, and ZnSnO/CdS electron transport layers (ETLs) have been investigated as double buffer layers for Sb 2 S 3 TFSCs. Herein, atomic-layer-deposited (ALD) SnO 2 and TiO 2 ETLs were applied as a double buffer layer with CdS for Sb 2 S 3 TFSCs. The Sb 2 S 3 absorber was deposited using a facile hydrothermal method. The TFSC devices were fabricated based on FTO/SnO 2 /CdS/Sb 2 S 3 /Au or FTO/TiO 2 /CdS/Sb 2 S 3 /Au structure without hole transport layers (HTLs). Experimental analysis revealed the reduction of the surface roughness of ETLs and decreased unfavorable (hk0) orientation of the Sb 2 S 3 absorber after utilizing double buffer layers. Initially, incomplete nucleation of Sb 2 S 3 was observed on SnO 2 and TiO 2 ETLs, which resulted in the formation of a shunting path. Conversely, complete nucleation of Sb 2 S 3 was observed on CdS and double buffer layers. The highest PCEs of 3.98% and 4.23% were obtained for SnO 2 /CdS and TiO 2 /CdS double-buffer-layer-based cells with improvements exceeding 1% compared with the reference CdS buffer layer. Additionally, improvements in open-circuit voltage ( V OC ) of the order of ∼25 mV and ∼45 mV were respectively observed for SnO 2 /CdS ( V OC = 0.676 V) and TiO 2 /CdS ( V OC = 0.696 V) double-buffer-layer-based devices compared with the reference CdS buffer layer ( V OC = 0.648 V). The enhanced device properties are mainly attributed to the improved charge carrier collection and formation of suitable band offset at the absorber and ETLs interfaces.
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