X射线光电子能谱
谱线
离子
氩
化学
Atom(片上系统)
X射线
分析化学(期刊)
主成分分析
结晶学
核磁共振
物理
有机化学
光学
计算机科学
人工智能
嵌入式系统
天文
作者
V. G. Beshenkov,S. Pestov
标识
DOI:10.1134/s1027451021010055
摘要
Principal component analysis in a dual formulation is proposed to interpret changes in the C 1s X‑ray photoelectron spectra, arising from modification of the surface of polyetheretherketone. The distribution of the spectral intensities considered together with the spectra on dual graphs is used to construct a model of the peak structure of the C 1s spectra for their subsequent decomposition into components. It is shown that after treatment of the surface of polyetheretherketone with accelerated ion and neutral beams of argon-atom clusters, 288.3- and 285.5-eV peaks appear in the C 1s spectra, which characterize the presence of carboxyl functional groups and aliphatic carbon atoms in the modified surface layer.
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