材料科学
宽禁带半导体
光电子学
功率MOSFET
结温
功率半导体器件
MOSFET
碳化硅
击穿电压
电压
温度测量
热导率
泄漏(经济)
饱和速度
安全操作区
热阻
工作温度
饱和电流
高压
半导体
电气工程
热的
晶体管
工程类
复合材料
物理
宏观经济学
气象学
经济
量子力学
作者
Feng Qi,Lixing Fu,Longya Xu,Ping Jing,Guoliang Zhao,Jiangbo Wang
标识
DOI:10.1109/itec-ap.2014.6941032
摘要
This paper characterizes and compares Si and SiC power MOSFETs in high temperature conditions. The superior advantages of SiC power device, including conductivity, breakdown voltage, high switching speed and high temperature operating potentials, are discussed based on the semiconductor physics properties, including bandgap energy, critical electric field, saturation velocity and thermal conductivity. In characterization of the power devices, the device threshold voltage, on-resistance and leakage current are measured and compared at different temperature levels. The operating characteristics variations are investigated to reveal the high temperature effects on the devices. A DC-DC boost converter with high temperature capability is built and tested in a thermal chamber at 150 °C. The testing results are used to demonstrate the potentials of SiC based power converter in high temperature conditions.
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