铁电性
范德瓦尔斯力
压电响应力显微镜
材料科学
凝聚态物理
反铁电性
偶极子
扫描透射电子显微镜
极化(电化学)
点反射
超晶格
压电
二次谐波产生
纳米技术
透射电子显微镜
光电子学
光学
电介质
化学
物理
复合材料
物理化学
量子力学
分子
激光器
作者
Lin Wang,Xin Zhou,Mengyao Su,Yishu Zhang,Runlai Li,Rongrong Zhang,Xiao Wu,Zhenyue Wu,Walter P. D. Wong,Qing‐Hua Xu,Qian He,Kian Ping Loh
出处
期刊:ACS Nano
[American Chemical Society]
日期:2023-12-18
卷期号:18 (1): 809-818
被引量:18
标识
DOI:10.1021/acsnano.3c09250
摘要
van der Waals ferroic materials exhibit rich potential for implementing future generation functional devices. Among these, layered β'-In2Se3 has fascinated researchers with its complex superlattice and domain structures. As opposed to ferroelectric α-In2Se3, the understanding of β'-In2Se3 ferroic properties remains unclear because ferroelectric, antiferroelectric, and ferroelastic characteristics have been separately reported in this material. To develop useful applications, it is necessary to understand the microscopic structural properties and their correlation with macroscopic device characteristics. Herein, using scanning transmission electron microscopy (STEM), we observed that the arrangement of dipoles deviates from the ideal double antiparallel antiferroelectric character due to competition between antiferroelectric and ferroelectric structural ordering. By virtue of second-harmonic generation, four-dimensional STEM, and in-plane piezoresponse force microscopy, the long-range inversion-breaking symmetry, uncompensated local polarization, and net polarization domains are unambiguously verified, revealing β'-In2Se3 as an in-plane ferrielectric layered material. Additionally, our device study reveals analogous resistive switching behaviors of different types owing to polarization switching, defect migration, and defect-induced charge trapping/detrapping processes.
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