通带
沉积(地质)
法布里-珀罗干涉仪
材料科学
滤波器(信号处理)
图层(电子)
薄膜
证人
带通滤波器
光电子学
计算机科学
电子工程
光学
纳米技术
工程类
地质学
物理
计算机视觉
波长
程序设计语言
古生物学
沉积物
作者
Janis Zideluns,Fabien Lemarchand,Frédéric Lemarquis,Detlef Arhilger,Harro Hagedorn,Julien Lumeau
出处
期刊:Optics continuum
[The Optical Society]
日期:2024-08-09
卷期号:3 (9): 1622-1622
标识
DOI:10.1364/optcon.533681
摘要
Narrow bandpass thin-film filters are frequently used for many applications that require frequency filtering. Although various designs and approaches have been studied in past decades, they still present serious challenges regarding deposition. Especially, as the required passband of the designs becomes narrower, the accuracy needed on layer thicknesses increases involving more difficulty to control the layers during deposition. This paper presents a multi-witness glass monitoring strategy for narrow thin film Fabry-Perot filter deposition.
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