化学机械平面化
电镀
铜互连
材料科学
湿法清洗
电镀(地质)
冶金
镀铜
蚀刻(微加工)
薄脆饼
化学气相沉积
各向同性腐蚀
抛光
铜
复合材料
图层(电子)
光电子学
化学
地质学
有机化学
地球物理学
作者
Cornelius Brown Peethala,James J. Kelly,D. Canaperi,Mahadevaiyer Krishnan,T. Nogami
出处
期刊:Springer handbooks
日期:2022-11-10
卷期号:: 219-257
被引量:3
标识
DOI:10.1007/978-3-030-79827-7_6
摘要
This chapter covers wet processes for logic back-end-of-the-line interconnect technology – namely, wet cleans and wet etching (Sect. 6.1), electroplating (Sect. 6.2), and chemical mechanical planarization (Sect. 6.3). Each section details the introduction of the process and equipment used in 300-mm semiconductor industry from the beginning of Cu era. All the critical components of the process and equipment are described followed by the experimental results and discussion for each of the application. In wet cleans and wet etching section, applications like post-etch residue clean, backside clean, and hardmask wet etch are covered. Plating section includes copper electroplating of damascene and dual damascene structures. In chemical mechanical planarization section, metal – copper, tantalum, tantalum nitride, and cobalt – polishing and planarization, and post-cleaning applications are covered.
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