X射线光电子能谱
谱线
反褶积
分析化学(期刊)
微晶
分辨率(逻辑)
消色差透镜
化学
金属
材料科学
原子物理学
核磁共振
光学
物理
结晶学
色谱法
天文
人工智能
计算机科学
有机化学
作者
David D. Hawn,Benjamin M. DeKoven
标识
DOI:10.1002/sia.740100203
摘要
Abstract In this paper core level XPS spectra of polycrystalline Fe metal and several oxides are corrected by deconvolution using the ratio method for energy loss effects and spectral broadening due to both an achromatic x‐ray source and finite analyzer resolution. These ideas are applied to the XPS spectra of Fe, FeO, Fe 2 O 3 , and Fe 3 O 4 in order to obtain the intrinsic lineshape. The backscattered electron energy loss spectra are effective in distinguishing Fe and its oxides. For Fe metal and its oxides, the electron energy loss deconvolved spectra have a flat baseline and enhanced resolution. This background removal method is found to be more reliable than either linear or sigmodial background approximations. This allows for a determination of the relative sensitivity factor for the Fe 2p and O 1s core levels.
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