| 标题 |
Radical etching with an aperture plate: correlating F atom density and highly selective etching of poly-Si and Si 3 N 4 over SiO 2 in CF 4 /O 2 /He plasma |
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| DOI | |
| 其它 |
期刊:Plasma Sources Science and Technology 作者:Yong Cao; Yuan Gao; Chaowei Yuan; Lijun Sang; Bowen Liu; et al 出版日期:2026-05-01 |
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(2025-6-4)