| 标题 |
Quantitative three-dimensional carrier mapping in nanowire-based transistors using scanning spreading resistance microscopy |
| 网址 | |
| DOI | |
| 其它 |
期刊:Ultramicroscopy 作者:A. Schulze; T. Hantschel; P. Eyben; A. Verhulst; R. Rooyackers; et al 出版日期:2013-02-01 |
| 求助人 | |
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(2025-6-4)