| 标题 |
Magnetic Field Imaging Using Diamond Nitrogen-Vacancy Centers for Fault Detection and Security of Semiconductor and Superconductor Electronics |
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| DOI | |
| 其它 |
期刊:2025 IEEE Physical Assurance and Inspection of Electronics (PAINE) 作者:Pauli Kehayias; Rohan T. Kapur; Michael Gold; Jennifer M. Schloss; Danielle A. Braje 出版日期:2025-10-14 |
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(2025-6-4)