| 标题 |
Application Research of a Deep Learning Model Integrating CycleGAN and YOLO in PCB Infrared Defect Detection |
| 网址 | |
| DOI |
10.48550/arxiv.2601.00237
doi
|
| 其它 |
期刊:Cornell University - arXiv 作者:Chao Yang; Haoyuan Zheng; Yue Ma 出版日期:2026-01-01 |
| 求助人 | |
| 下载 |
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(2025-6-4)