Traceable Measurement of Terahertz Spectrum Power and Frequency
作者
Yuqiang Deng,Qing Sun,Chaochen Li,Ying Meng,Shuheng Guo,Xin Liu
标识
DOI:10.1109/imws-amp49156.2020.9199706
摘要
Terahertz metrology plays an important role in terahertz applications. National Institute of Metrology carried out research on measurement standards for key parameters traceable measurement of terahertz radiation. The measurement technology and measurement standards for temporal, spectral, spatial and radiant parameters of terahertz are introduced, and Traceable measurement of terahertz spectrum, power and frequency in this paper.