碳化硅
材料科学
功率半导体器件
光电子学
晶体管
肖特基二极管
晶闸管
二极管
静电感应晶体管
雪崩二极管
电气工程
肖特基势垒
电力电子
场效应晶体管
双极结晶体管
击穿电压
数码产品
金属半导体结
结温
电接点
功率(物理)
电压
工程类
物理
冶金
量子力学
作者
James A. Cooper,Anant Agarwal
出处
期刊:Proceedings of the IEEE
[Institute of Electrical and Electronics Engineers]
日期:2002-06-01
卷期号:90 (6): 956-968
被引量:382
标识
DOI:10.1109/jproc.2002.1021561
摘要
Silicon carbide (SiC) offers significant advantages for power-switching devices because the critical field for avalanche breakdown is about ten times higher than in silicon. SiC power devices have made remarkable progress in the past five years, demonstrating currents in excess of 100 A and blocking voltages in excess of 19000 V. In this paper we describe the latest progress in three classes of SiC devices: diodes (p-i-n and Schottky), transistors (junction field-effect transistor, metal-oxide-semiconductor field-effect transistor, and bipolar junction transistor), and thyristors (gate turn-off).
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