发光
放射发光
分辨率(逻辑)
材料科学
X射线
光电子学
硅光电倍增管
探测器
纳米技术
光学
物理
闪烁体
计算机科学
人工智能
作者
Xiangyu Ou,Xian Qin,Bolong Huang,Jie Zan,Qinxia Wu,Zhongzhu Hong,Linghai Xie,Hongyu Bian,Zhigao Yi,Xiaofeng Chen,Yiming Wu,Xiaorong Song,Juan Li,Qiushui Chen,Huanghao Yang,Xiaogang Liu
出处
期刊:Nature
[Springer Nature]
日期:2021-02-17
卷期号:590 (7846): 410-415
被引量:375
标识
DOI:10.1038/s41586-021-03251-6
摘要
Current X-ray imaging technologies involving flat-panel detectors have difficulty in imaging three-dimensional objects because fabrication of large-area, flexible, silicon-based photodetectors on highly curved surfaces remains a challenge1–3. Here we demonstrate ultralong-lived X-ray trapping for flat-panel-free, high-resolution, three-dimensional imaging using a series of solution-processable, lanthanide-doped nanoscintillators. Corroborated by quantum mechanical simulations of defect formation and electronic structures, our experimental characterizations reveal that slow hopping of trapped electrons due to radiation-triggered anionic migration in host lattices can induce more than 30 days of persistent radioluminescence. We further demonstrate X-ray luminescence extension imaging with resolution greater than 20 line pairs per millimetre and optical memory longer than 15 days. These findings provide insight into mechanisms underlying X-ray energy conversion through enduring electron trapping and offer a paradigm to motivate future research in wearable X-ray detectors for patient-centred radiography and mammography, imaging-guided therapeutics, high-energy physics and deep learning in radiology. Using lanthanide-doped nanomaterials and flexible substrates, an approach that enables flat-panel-free, high-resolution, three-dimensional imaging is demonstrated and termed X-ray luminescence extension imaging.
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