Low-power electronic technologies for harsh radiation environments

Electronic technologies that can operate in harsh radiation environments are important in space, nuclear and avionic applications. However, radiation-hardened (rad-hard) integrated circuits often require additional processing and more complex configurations than conventional systems. Here we review the development of low-power, rad-hard electronics, examining the underlying phenomena of radiation-induced electronic failure and the design methodologies available with conventional complementary metal–oxide–semiconductor (CMOS) technologies to mitigate the problem. We also explore the potential use and applications of various emerging memory technologies in rad-hard electronics. This Review examines the development of radiation-hardened electronics, considering the design methodologies available with conventional complementary metal–oxide–semiconductor (CMOS) technologies and the potential use and applications of emerging memory technologies.