| 标题 |
Effects of KIO4 concentration and pH values of the solution relevant for chemical mechanical polishing of ruthenium |
| 网址 | |
| DOI | |
| 其它 |
期刊:Microelectronic Engineering 作者:Jie Cheng; Tongqing Wang; Jie Wang; Yuhong Liu; Xinchun Lu 出版日期:2016-02-05 |
| 求助人 | |
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(2025-6-4)