降级(电信)
可靠性(半导体)
压力(语言学)
材料科学
加速老化
可靠性工程
电子工程
复合材料
工程类
热力学
物理
语言学
哲学
功率(物理)
作者
Hui Juan Yuan,Jun Zhong Li,Zi Mei Su,En Jing Zhang,Ying Yan,Dan Dan Hu
出处
期刊:Applied Mechanics and Materials
[Trans Tech Publications, Ltd.]
日期:2014-10-01
卷期号:667: 364-367
被引量:2
标识
DOI:10.4028/www.scientific.net/amm.667.364
摘要
According to the reliability assessment of the SnO2 gas sensor, an accelerate degradation model was established by using temperature as the accelerated stress, the constant stress accelerated degradation testing (CSADT) was designed and conducted. The reliability of SnO2 gas sensor under the normal stress level was assessed based on pseudo life.
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