纹理(宇宙学)
结构精修
材料科学
衍射
方向(向量空间)
粉末衍射
强度(物理)
功能(生物学)
样品(材料)
结晶学
复合材料
数学
光学
计算机科学
人工智能
几何学
图像(数学)
物理
热力学
化学
生物
进化生物学
作者
James P. Cline,Mark D. Vaudin,John E. Blended,Carol A. Handwerker,Rodney D. Jiggetts,Keith J. Bowman,N. Medendorp
出处
期刊:Advances in x-ray analysis
[International Centre for Diffraction Data]
日期:1993-01-01
卷期号:37: 473-478
被引量:9
标识
DOI:10.1154/s0376030800016001
摘要
The Rietveld method entails the calculation of a powder diffraction pattern from crystallographic, microstructural and equipment characteristics. These characteristics are related to the form of the pattern through a series of model functions. The difference between an observed and calculated pattern is then minimized by sequentially refining the physical parameters contained within the mode) functions to obtain an accurate and precise description of the specimen. A powder diffraction pattern from a specimen exhibiting cry stallo graphic texture, or preferred orientation, will display intensity values which differ systematically from those calculated for a specimen of random orientation. This systematic discrepancy can be addressed by incorporating into the Rietveld refinement a model function for sample texture. A successful model for texture will accurately assess the phase abundance and degree of texture from both oriented and randomized specimens. In this study we use the March-Dollase model function to characterize texture development in sintered alumina with respect to processing variables and sintering time.
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